On the Transmission Line Pulse Measurement Technique
نویسندگان
چکیده
Transmission Line Pulse is a short pulse (25ns to 150ns) measurement of the current-voltage (I/V) characteristics of the ESD protection built into an integrated circuit. The short TLP pulses are used to simulate the short ESD pulse threats and integrated circuit must tolerate without being damaged. In this work the fundamental principles of how the TLP pulse is generated and used to create I-V characteristic plots will be explored. The measurement will be then used to characterize the I-V characteristics of some electronic parts to see how it can help arriving at accurate results. KEYWORDS–Transmission Line Pulse, TLP, Device, Measurement
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